TM11-6125-256-34
collector of transistor Q4 If the measurements are not
(4) If the waveshapes measured in step (3) indi-
approximately as shown in fig 4-3 14, localize failure
cate that capacitor C1 and associated components are
within this circuit
functioning normally, make measurements at the base
(7) If the waveshapes measured in step (6) indi-
and collector of transistor Q2 If the measurements are
cate that transistor Q4 and associated components are
not approximately as shown in fig 4-3 12, localize
functioning normally, make measurements at the base
failure within this circuit
collector of transistor Q5 If the measurements are not
(5) If the waveshapes measured in step (4) indi-
approximately as shown in fig 4-3 15, localize failure
cate that transistor Q2 and associated components are
within this circuit
functioning normally, make measurements at the base
(8) If the waveshapes measured in step (7) indi-
and collector of transistor Q3 If the measurements are
cate that transistor Q5 and associated components are
not approximately as shown in fig. 4-3 13, localize
functioning normally, make measurements at the base
failure within this circuit
(6) If the waveshapes measured in step (5) indi-
collector of transistor Q6 If the measurements are not
cate that transistor Q3 and associated components are
approximately as shown in fig 4-3 16, localize failure
functioning normally make measurements at the base
within this circuit
